Data Mining and Diagnosing IC Fails

Data Mining and Diagnosing IC Fails
Springer | 2005 | ISBN: 0387249931 | 250 pages | PDF | 10,4 MB

There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose.

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